Cryogenic Probe Stations play a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples in a low-temperature environment, which helps researchers gain a deeper understanding of the physical and electrical properties of materials or devices, thus providing important data support for the development and application of new materials.

PSM-EM low-temperature probe stage is a closed-cycle horizontal magnetic field electromagnet probe stage, through the addition of +0.6T horizontal electromagnet strengthens the performance of the standard probe stage, can be for the semiconductor chip electrical parameter testing to provide a 4.5K-350K high and low-temperature vacuum test environment, which can be done for all the standard I, CV, microwave and optoelectronic experiments and the level of the electromagnetic field measurements, the researcher can It can perform all standard I, CV, microwave and optoelectronic experiments and horizontal electromagnetic field measurements, and researchers can perform magnetic transport measurements with it. The PSM-EM is a high quality cryogenic probe station for vectorial magnetic transport measurements, which can achieve both large magnetic fields in samples and non-destructive electrical testing of chips, wafers, and devices in cryogenic vacuum environments.